000 01167cam a22003014a 4500
001 12883029
003 OSt
005 20250115125244.0
008 020803s2003 nyua b 001 0 eng
010 _a 2002028276
020 _a0306472929
040 _aDLC
_cDLC
_dDLC
042 _apcc
050 0 0 _aQH212.S3
_bS29 2003
082 0 0 _a502/.8/25
_221
245 0 0 _aScanning electron microscopy and x-ray microanalysis /
_cJoseph I. Goldstein ... [et al.].
250 _a3rd ed.
260 _aNew York :
_bKluwer Academic/Plenum Publishers,
_cc2003.
300 _axix, 689 p. :
_bill. (some col.) ;
_c26 cm. +
_e1 CD-ROM (4 3/4 in.)
504 _aIncludes bibliographical references and index.
650 0 _aScanning electron microscopy.
650 0 _aX-ray microanalysis.
700 1 _aGoldstein, Joseph,
_d1939-
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0813/2002028276-d.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2lcc
_cBOOK01
_e3rd ed.
_kQH212
_mG31
999 _c694
_d694