000 | 01167cam a22003014a 4500 | ||
---|---|---|---|
001 | 12883029 | ||
003 | OSt | ||
005 | 20250115125244.0 | ||
008 | 020803s2003 nyua b 001 0 eng | ||
010 | _a 2002028276 | ||
020 | _a0306472929 | ||
040 |
_aDLC _cDLC _dDLC |
||
042 | _apcc | ||
050 | 0 | 0 |
_aQH212.S3 _bS29 2003 |
082 | 0 | 0 |
_a502/.8/25 _221 |
245 | 0 | 0 |
_aScanning electron microscopy and x-ray microanalysis / _cJoseph I. Goldstein ... [et al.]. |
250 | _a3rd ed. | ||
260 |
_aNew York : _bKluwer Academic/Plenum Publishers, _cc2003. |
||
300 |
_axix, 689 p. : _bill. (some col.) ; _c26 cm. + _e1 CD-ROM (4 3/4 in.) |
||
504 | _aIncludes bibliographical references and index. | ||
650 | 0 | _aScanning electron microscopy. | |
650 | 0 | _aX-ray microanalysis. | |
700 | 1 |
_aGoldstein, Joseph, _d1939- |
|
856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0813/2002028276-d.html |
906 |
_a7 _bcbc _corignew _d1 _eocip _f20 _gy-gencatlg |
||
942 |
_2lcc _cBOOK01 _e3rd ed. _kQH212 _mG31 |
||
999 |
_c694 _d694 |